Nanoscientific Forum Europe (NSFE)  is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM).

The 6th NSFE 2022 will take place in-person at ICFO – The Institute of Photonic Sciences in Barcelona Spain hosted by Prof. Dr. F. Pelayo García de Arquer, from 13th to 15th September 2023. The research focus of the will be laid on wide range of SPM applications and techniques that empower to transform life standards. We will talk about emerging nanomaterials for advanced technologies, functional surfaces, and hybrid materials as well as innovative methods in nanotechnology and correlative microscopy.

REGISTRATION is open now!

After three years of online editions, we are proud to invite scientists and researchers working in the field of Scanning Probe Microscopy to the in-person NSFE 2023 in magnificent Barcelona! The scientific focus will be on wide range of SPM applications and techniques that enable the transformation of life standards. We will talk about emerging nanomaterials for advanced technologies, functional surfaces, and hybrid materials as well as innovative methods in nanotechnology and correlative microscopy.

Eventdatum: 13.09.23 – 15.09.23

Eventort: Barcelona

Der Beitrag 2023 NANOscientific Forum Europe (Konferenz | Barcelona) erschien zuerst auf Local Guides.

Fraunhofer IISB and Park Systems are announcing the call for abstracts as well as opening registration for the 2nd International Symposium on Failure Analysis and Material Testing – FAMT 2022.

 This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future. 

The event is going to be held in a hybrid form: 

ON-SITE VENUE: Fraunhofer IISB, Schottkystrasse 10, Erlangen, Germany

VIRTUAL PLATFORM: Zoom

he design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range. Are you experiencing similar challenges in your daily work? Join us on July 22, 2022! 

Eventdatum: Freitag, 22. Juli 2022 08:30 – 13:30

Eventort: Online

Der Beitrag International Symposium on Failure Analysis and Material Testing – FAMT 2022 (Konferenz | Online) erschien zuerst auf Local Guides.

NSFE series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM). 

The research focus of the 5th NSFE 2022 will be laid on wide range of SPM applications and techniques that empower to transform life standards. We will talk about emerging nanomaterials for advanced technologies, functional surfaces and hybrid materials as well as innovative methods in nanotechnology and correlative microscopy. This edition is open to global audience and will be held online.

Topics

• Emerging Nanomaterials for Advanced Technologies

• Functional Surfaces

• Advanced Techniques and Automation in SPM

• Correlative Microscopy

SPM Methods

• Nanomechanical and Electrical Characterization

• Characterization of soft materials in liquid environment

• Advanced Imaging

• High resolution imaging

• Automation in AFM

Scientific Committee

• Prof. Dr. Lukas Eng, Technical University Dresden
• Dr. Bizan Balzer, University Freiburg

• Dr. Tobias Cramer, University of Bologna

• Dr. Ilka Hermes, Leibniz Institute of Polymer Research Dresden

• Dr.-Ing. Lisa Ditscherlein, TU Bergakademie Freiberg

• Prof. Brian Rodriguez, 
  University College Dublin

Eventdatum: 06.10.22 – 07.10.22

Eventort: Online

Der Beitrag 2022 NanoScientific Forum Europe (Konferenz | Online) erschien zuerst auf Local Guides.

Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.

Are you experiencing similar challenges in your daily work? Join us on July 1, 2021!

This symposium gathers the professionals from the electronic industry to discuss innovative testing methods and tools for failure analysis of the future.

The program will include keynote talks ranging from case studies in the semiconductor device applications, innovative methods and tools for material characterization and defect review, emerging applications in the electronic industry up to future methods for increasing line productivity, efficiency, and yield. The symposium is going to be held as a virtual event. Access is free of charge.

Eventdatum: Donnerstag, 01. Juli 2021 14:00 – 18:00

Eventort: Online

Der Beitrag International Symposium on Failure Analysis and Material Testing – FAMT 2021 (Konferenz | Online) erschien zuerst auf Local Guides.

NanoScientific Forum Europe (NSFE) series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM).

The third NanoScientific Forum Europe  (#NSFE2020) will focus on nanoscale functional materials, such as organics, organic/inorganic hybrid semiconductors, nano- and biomaterials, as well as the development of novel nanometrology methods.

NSFE 2020 will be hosted by Prof. Kim McKelvey, School of Chemistry at Trinity College Dublin, and by Prof. Brian Rodriguez, School of Physics at University College Dublin.

TOPICS:

Application

• Energy Storage
• Nanophotonics and Nanoelectronics
• Organic, inorganic and hybrid Semiconductors
• Nanomaterials and Biotechnology
• Special Session: Electrochemical & Electromechanical Properties in Functional Materials

Method:

• Nanomechanical and Electrical Characterization
• Characterization of soft materials in liquid environment
• Advanced Imaging

An exciting agenda is planned for the 2.5 days:

• Lectures by renowned AFM researchers
• Instrument workshops on Park Systems AFMs, including basic and advanced measuring techniques as well as tips and tricks, how to obtain stunning AFM data
• Poster session and image contest with amazing prizes!
• Evening Program

Conference venue:

Science Gallery Dublin

Address:

Trinity College Dublin

Pearse St, Dublin 2, Ireland
https://dublin.sciencegallery.com/

Conference Contact:

Conference Organizer: Justyna Sliwa nsfe@parksystems.com

Eventdatum: 23.09.20 – 25.09.20

Eventort: Dublin

Der Beitrag 2020 NanoScientific Forum Europe (NSFE 2020) (Konferenz | Dublin) erschien zuerst auf Local Guides.